Home
學生控制台
註冊會員/登入
研究知情同意書
UeduGPTs
Aida 優學伴
Uedu Open
支援與訊息

UeduGPTs

--

Jupyters

3

AI 回覆桌面通知

AI 助教回覆完成時顯示桌面通知

聊天訊息通知

同學在討論區發送訊息時通知

聲音通知

每當有新通知時播放提示音

Uedu Open / Physics of Microfabrication: Front End Processing
6.774

Physics of Microfabrication: Front End Processing

Prof. Judy Hoyt, Prof. L. Rafael Reif | Fall 2004
Science & Math Physics Engineering Materials Science and Engineering Mechanical Engineering Condensed Matter Physics Electronic Materials Microtechnology
前往原始課程
CC BY-NC-SA 4.0
課程簡介
This course is offered to graduates and focuses on understanding the fundamental principles of the “front-end” processes used in the fabrication of devices for silicon integrated circuits. This includes advanced physical models and practical aspects of major processes, such as oxidation, diffusion, ion implantation, and epitaxy. Other topics covered include: high performance MOS and bipolar devices including ultra-thin gate oxides, implant-damage enhanced diffusion, advanced metrology, and new materials such as Silicon Germanium (SiGe).
課程資訊
來源MIT 開放式課程
科系Electrical Engineering and Computer Science
語言English
影片數21
課程影片 (21)
1
3. Crystal Growth, Wafer Fabrication, and Basic Properties of Si Wafers (cont.)
3. Crystal Growth, Wafer Fabrication, and Basic Properties of Si Wafers (cont.)
2
4. Wafer Cleaning and Gettering (cont.)
4. Wafer Cleaning and Gettering (cont.)
3
5. Wafer Cleaning and Gettering - Contamination Measurement Techniques
5. Wafer Cleaning and Gettering - Contamination Measurement Techniques
4
6. Oxidation and the Si/SiO2 Interface. Deal/Grove Model, Thin Oxide Models
6. Oxidation and the Si/SiO2 Interface. Deal/Grove Model, Thin Oxide Models
5
7. Oxidation and the Si/SiO2 Interface. 2D Effects, Doping Effects, Point Defect
7. Oxidation and the Si/SiO2 Interface. 2D Effects, Doping Effects, Point Defect
6
8. Dopant Diffusion - Need for Abrupt Profiles, Fick's Laws, Simple Analytic
8. Dopant Diffusion - Need for Abrupt Profiles, Fick's Laws, Simple Analytic
7
9. Dopant Diffusion - Numerical Techniques in Diffusion, E Field Effects
9. Dopant Diffusion - Numerical Techniques in Diffusion, E Field Effects
8
10. Dopant Diffusion - Fermi Level Effects, I and V Assisted Diffusion
10. Dopant Diffusion - Fermi Level Effects, I and V Assisted Diffusion
9
11. Dopant Diffusion - Review Atomic Scale Models, Profile Measurement Techniques
11. Dopant Diffusion - Review Atomic Scale Models, Profile Measurement Techniques
10
12. Ion Implantation and Annealing - Analytic Models and Monte Carlo
12. Ion Implantation and Annealing - Analytic Models and Monte Carlo
11
13. Ion Implantation and Annealing - Physics of E Loss, Damage, Introduction to TED
13. Ion Implantation and Annealing - Physics of E Loss, Damage, Introduction to TED
12
14. Transient Enhanced Diffusion (TED) - +1 Model, (311) Defects and TED Introduction
14. Transient Enhanced Diffusion (TED) - +1 Model, (311) Defects and TED Introduction
13
15. Transient Enhanced Diffusion (TED) - Simulation Examples, TED Calculations, RSCE in detail
15. Transient Enhanced Diffusion (TED) - Simulation Examples, TED Calculations, RSCE in detail
14
16. The SUPREM IV Process Simulator
16. The SUPREM IV Process Simulator
15
17. Thin Film Deposition and Epitaxy - Introduction to CVD, Si Epitaxial Growth
17. Thin Film Deposition and Epitaxy - Introduction to CVD, Si Epitaxial Growth
16
18. Thin Film Deposition and Epitaxy - CVD Examples and PVD
18. Thin Film Deposition and Epitaxy - CVD Examples and PVD
17
19. Thin Film Deposition and Epitaxy - Modeling Topography of Deposition
19. Thin Film Deposition and Epitaxy - Modeling Topography of Deposition
18
20. Etching - Introduction
20. Etching - Introduction
19
21. Etching - Poly Gate Etching, Stringers, Modeling of Etching
21. Etching - Poly Gate Etching, Stringers, Modeling of Etching
20
22. Silicides, Device Contacts, Novel Gate Materials
22. Silicides, Device Contacts, Novel Gate Materials
21
23. Growth and Processing of Strained Si/SiGe and Stress Effects on Devices
23. Growth and Processing of Strained Si/SiGe and Stress Effects on Devices